Profile mapping analysis of deteriorated cultural property with micro X-ray diffractometer.
نویسندگان
چکیده
منابع مشابه
An X-ray diffractometer using mirage diffraction
Some characteristics are reported of a triple-crystal diffractometer with a (+, -, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractomet...
متن کاملPyroelectric Crystal-Based X-Ray Diffractometer by
We investigate the use of an Amptek Cool-X X-ray Generator for an instructional tool in the physics of x-rays, as well as a source for x-rays for crystal diffraction experiments. The x-ray source is a solid-state two-phase air-cooled source with a timevarying photon output. Two detectors are used in this experiment, the first being an Amptek X-123 Spectrometer and the second a combination scint...
متن کاملSurface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis
An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
متن کاملX-ray diffraction peak profile analysis of maraged Fe-Ni-Mn steels
X-ray diffraction peak profile analysis was used to identify changes in the lattice distortions during isothermal aging of Fe-10Ni-7Mn (wt. %) maraging steel. Integral peak breadths were analyzed using classical Williamson-Hall equation taking the elastic anisotropy into account. It was found that substantial lattice distortions rise during precipitation hardening which depend strongly on the s...
متن کاملHigh-energy x-ray micro-mapping of materials: engineering applications
Introduction and organization The use of synchrotron based high-energy x-ray scattering in materials/engineering programs is relatively new to both the synchrotron and engineering communities in the United States. In Europe such efforts are more advanced with engineering beam lines existent or under construction at ESRF in France, at PETRA III in Germany, and at Diamond in England. The industri...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: BUNSEKI KAGAKU
سال: 1992
ISSN: 0525-1931
DOI: 10.2116/bunsekikagaku.41.11_597